Ryoji Ikeda
Information
Born. 1959 (Japan)
test pattern
2008 - Present
"test pattern is a system that converts any type of data (text, sounds, photos and movies) into barcode patterns and binary patterns of 0s and 1s. Through its application, the project aims to examine the relationship between critical points of device performance and the threshold of human perception."
https://www.ryojiikeda.com/
test pattern, 2011
photo: James Ewing, courtesy of Park Avenue Armory